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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anzhela_Yu._Matrosova>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Valentina_Andreeva>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISVLSI54635.2022.00027>
foaf:homepage <https://doi.org/10.1109/ISVLSI54635.2022.00027>
dc:identifier DBLP conf/isvlsi/LaputenkoYAM22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISVLSI54635.2022.00027 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits. (xsd:string)
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swrc:pages 80-85 (xsd:string)
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dc:title Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits. (xsd:string)
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rdf:type swrc:InProceedings
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