Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/isvlsi/LaputenkoYAM22
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Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits.
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Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits.
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