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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isvlsi/RamosR23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elias_de_Almeida_Ramos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ricardo_Reis_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISVLSI59464.2023.10238486>
foaf:homepage <https://doi.org/10.1109/ISVLSI59464.2023.10238486>
dc:identifier DBLP conf/isvlsi/RamosR23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISVLSI59464.2023.10238486 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Using Lyapunov Exponents and Entropy to Estimate Sensitivity to Process Variability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elias_de_Almeida_Ramos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ricardo_Reis_0001>
swrc:pages 1-6 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2023.html#RamosR23>
rdfs:seeAlso <https://doi.org/10.1109/ISVLSI59464.2023.10238486>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isvlsi>
dc:title Using Lyapunov Exponents and Entropy to Estimate Sensitivity to Process Variability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document