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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isvlsi/Shaer04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bassam_Shaer>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISVLSI.2004.1339560>
foaf:homepage <https://doi.org/10.1109/ISVLSI.2004.1339560>
dc:identifier DBLP conf/isvlsi/Shaer04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISVLSI.2004.1339560 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Concurrent Pseudo-Exhaustive Testing of Combinational VLSI Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bassam_Shaer>
swrc:pages 289-290 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isvlsi/2004>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2004.html#Shaer04>
rdfs:seeAlso <https://doi.org/10.1109/ISVLSI.2004.1339560>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isvlsi>
dc:title Concurrent Pseudo-Exhaustive Testing of Combinational VLSI Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document