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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isvlsi/ShaerAA03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bassam_Shaer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kailash_Aurangabadkar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nitin_Agarwal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISVLSI.2003.1183484>
foaf:homepage <https://doi.org/10.1109/ISVLSI.2003.1183484>
dc:identifier DBLP conf/isvlsi/ShaerAA03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISVLSI.2003.1183484 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Testable Sequential Circuit Design: Partitioning for Pseudoexhaustive Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bassam_Shaer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kailash_Aurangabadkar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nitin_Agarwal>
swrc:pages 244-245 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isvlsi/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isvlsi/ShaerAA03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isvlsi/ShaerAA03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isvlsi/isvlsi2003.html#ShaerAA03>
rdfs:seeAlso <https://doi.org/10.1109/ISVLSI.2003.1183484>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isvlsi>
dc:title Testable Sequential Circuit Design: Partitioning for Pseudoexhaustive Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document