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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isvlsi/ShiFDGHS05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andreas_Glowatz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Friedrich_Hapke>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%E2%88%82rschwin_Fey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%C4%BErgen_Schl%E2%88%9A%E2%88%82ffel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Junhao_Shi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rolf_Drechsler>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISVLSI.2005.55>
foaf:homepage <https://doi.org/10.1109/ISVLSI.2005.55>
dc:identifier DBLP conf/isvlsi/ShiFDGHS05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISVLSI.2005.55 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andreas_Glowatz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Friedrich_Hapke>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%E2%88%82rschwin_Fey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%C4%BErgen_Schl%E2%88%9A%E2%88%82ffel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Junhao_Shi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rolf_Drechsler>
swrc:pages 212-217 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ISVLSI.2005.55>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isvlsi>
dc:title PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document