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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc-asia/ChuangHWLTCW20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chia-Heng_Tsai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chien-Hui_Chuang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hao_Chen_0053>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuan-Wei_Hou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Min-Jer_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mincent_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC-Asia51099.2020.00014>
foaf:homepage <https://doi.org/10.1109/ITC-Asia51099.2020.00014>
dc:identifier DBLP conf/itc-asia/ChuangHWLTCW20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC-Asia51099.2020.00014 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chia-Heng_Tsai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chien-Hui_Chuang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hao_Chen_0053>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuan-Wei_Hou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Min-Jer_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mincent_Lee>
swrc:pages 13-18 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc-asia/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc-asia/ChuangHWLTCW20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc-asia/ChuangHWLTCW20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2020.html#ChuangHWLTCW20>
rdfs:seeAlso <https://doi.org/10.1109/ITC-Asia51099.2020.00014>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc-asia>
dc:title A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document