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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc-asia/DouYZHCN00W20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aibin_Yan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jie_Cui_0004>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Zhou_0016>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tianming_Ni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoqing_Wen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yan_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuanjie_Hu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhengda_Dou>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC-Asia51099.2020.00018>
foaf:homepage <https://doi.org/10.1109/ITC-Asia51099.2020.00018>
dc:identifier DBLP conf/itc-asia/DouYZHCN00W20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC-Asia51099.2020.00018 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aibin_Yan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jie_Cui_0004>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Zhou_0016>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tianming_Ni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoqing_Wen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yan_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuanjie_Hu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhengda_Dou>
swrc:pages 35-40 (xsd:string)
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owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc-asia/DouYZHCN00W20/dblp>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2020.html#DouYZHCN00W20>
rdfs:seeAlso <https://doi.org/10.1109/ITC-Asia51099.2020.00018>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc-asia>
dc:title Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document