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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc-asia/KawabataASYK17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haruo_Kobayashi_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Asami>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masayuki_Kawabata>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shohei_Shibuya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomonori_Yanagida>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC-ASIA.2017.8097100>
foaf:homepage <https://doi.org/10.1109/ITC-ASIA.2017.8097100>
dc:identifier DBLP conf/itc-asia/KawabataASYK17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC-ASIA.2017.8097100 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haruo_Kobayashi_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Asami>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masayuki_Kawabata>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shohei_Shibuya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomonori_Yanagida>
swrc:pages 2-7 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc-asia/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc-asia/KawabataASYK17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc-asia/KawabataASYK17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2017.html#KawabataASYK17>
rdfs:seeAlso <https://doi.org/10.1109/ITC-ASIA.2017.8097100>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc-asia>
dc:title Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document