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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc-asia/ShibasakiAKMDHK19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Akemi_Hatta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anna_Kuwana>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haruo_Kobayashi_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuyoshi_Kubo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Asami>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kosuke_Machida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuanyang_Du>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yukiko_Shibasaki>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC-Asia.2019.00015>
foaf:homepage <https://doi.org/10.1109/ITC-Asia.2019.00015>
dc:identifier DBLP conf/itc-asia/ShibasakiAKMDHK19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC-Asia.2019.00015 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Akemi_Hatta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anna_Kuwana>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haruo_Kobayashi_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuyoshi_Kubo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Asami>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kosuke_Machida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuanyang_Du>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yukiko_Shibasaki>
swrc:pages 7-12 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc-asia/2019>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc-asia/ShibasakiAKMDHK19/dblp>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2019.html#ShibasakiAKMDHK19>
rdfs:seeAlso <https://doi.org/10.1109/ITC-Asia.2019.00015>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc-asia>
dc:title Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document