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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc-asia/YehC20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chung-Huang_Yeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC-Asia51099.2020.00027>
foaf:homepage <https://doi.org/10.1109/ITC-Asia51099.2020.00027>
dc:identifier DBLP conf/itc-asia/YehC20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC-Asia51099.2020.00027 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chung-Huang_Yeh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
swrc:pages 88-93 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc-asia/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc-asia/YehC20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc-asia/YehC20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2020.html#YehC20>
rdfs:seeAlso <https://doi.org/10.1109/ITC-Asia51099.2020.00027>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc-asia>
dc:title The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document