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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/Aldrete-VidrioOAMS09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Diego_Mateo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eduardo_Aldrete-Vidrio>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Silva-Mart%E2%88%9A%E2%89%A0nez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Josep_Altet>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marvin_Onabajo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2009.5355901>
foaf:homepage <https://doi.org/10.1109/TEST.2009.5355901>
dc:identifier DBLP conf/itc/Aldrete-VidrioOAMS09 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2009.5355901 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Non-invasive RF built-in testing using on-chip temperature sensors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Diego_Mateo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eduardo_Aldrete-Vidrio>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Silva-Mart%E2%88%9A%E2%89%A0nez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Josep_Altet>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marvin_Onabajo>
swrc:pages 1 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2009>
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rdfs:seeAlso <https://doi.org/10.1109/TEST.2009.5355901>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Non-invasive RF built-in testing using on-chip temperature sensors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document