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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/ArmstrongM16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dave_Armstrong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gary_Maier>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2016.7805851>
foaf:homepage <https://doi.org/10.1109/TEST.2016.7805851>
dc:identifier DBLP conf/itc/ArmstrongM16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2016.7805851 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label Known-good-die test methods for large, thin, high-power digital devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dave_Armstrong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gary_Maier>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2016>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/ArmstrongM16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/ArmstrongM16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2016.html#ArmstrongM16>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2016.7805851>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Known-good-die test methods for large, thin, high-power digital devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document