Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/ArunachalamDRSJ23
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/itc/ArunachalamDRSJ23
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Arnab_Raha
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ayush_Arunachalam
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fei_Su
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kanad_Basu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Monikka_Rajan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sanjay_Das
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Suriyaprakash_Natarajan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Suvadeep_Banerjee
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Xiankun_Jin
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FITC51656.2023.00043
>
foaf:
homepage
<
https://doi.org/10.1109/ITC51656.2023.00043
>
dc:
identifier
DBLP conf/itc/ArunachalamDRSJ23
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FITC51656.2023.00043
(xsd:string)
dcterms:
issued
2023
(xsd:gYear)
rdfs:
label
Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Arnab_Raha
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ayush_Arunachalam
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fei_Su
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kanad_Basu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Monikka_Rajan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sanjay_Das
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Suriyaprakash_Natarajan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Suvadeep_Banerjee
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Xiankun_Jin
>
swrc:
pages
266-275
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/itc/2023
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/itc/ArunachalamDRSJ23/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/itc/ArunachalamDRSJ23
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/itc/itc2023.html#ArunachalamDRSJ23
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ITC51656.2023.00043
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/itc
>
dc:
title
Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document