On-chip diagnosis for early-life and wear-out failures.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/BecklerB12
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Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/itc/BecklerB12
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Matthew_Beckler
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTEST.2012.6401580
>
foaf:
homepage
<
https://doi.org/10.1109/TEST.2012.6401580
>
dc:
identifier
DBLP conf/itc/BecklerB12
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTEST.2012.6401580
(xsd:string)
dcterms:
issued
2012
(xsd:gYear)
rdfs:
label
On-chip diagnosis for early-life and wear-out failures.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Matthew_Beckler
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton
>
swrc:
pages
1-10
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/itc/2012
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/itc/BecklerB12/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/itc/BecklerB12
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/itc/itc2012.html#BecklerB12
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TEST.2012.6401580
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/itc
>
dc:
title
On-chip diagnosis for early-life and wear-out failures.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document