[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/BeestPVBK02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad_M._G._Peeters>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frank_te_Beest>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_G._Kerkhoff>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kees_van_Berkel_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marc_Verra>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2002.1041834>
foaf:homepage <https://doi.org/10.1109/TEST.2002.1041834>
dc:identifier DBLP conf/itc/BeestPVBK02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2002.1041834 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Automatic Scan Insertion and Test Generation for Asynchronous Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad_M._G._Peeters>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frank_te_Beest>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_G._Kerkhoff>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kees_van_Berkel_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marc_Verra>
swrc:pages 804-813 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/BeestPVBK02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/BeestPVBK02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2002.html#BeestPVBK02>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2002.1041834>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Automatic Scan Insertion and Test Generation for Asynchronous Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document