Fault Tuples in Diagnosis of Deep-Submicron Circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/BlantonCDDMV02
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/itc/BlantonCDDMV02
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/John_T._Chen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kumar_N._Dwarakanath
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rao_Desineni
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ronald_D._Blanton
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Thomas_J._Vogels
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTEST.2002.1041765
>
foaf:
homepage
<
https://doi.org/10.1109/TEST.2002.1041765
>
dc:
identifier
DBLP conf/itc/BlantonCDDMV02
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTEST.2002.1041765
(xsd:string)
dcterms:
issued
2002
(xsd:gYear)
rdfs:
label
Fault Tuples in Diagnosis of Deep-Submicron Circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/John_T._Chen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kumar_N._Dwarakanath
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rao_Desineni
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ronald_D._Blanton
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Thomas_J._Vogels
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly
>
swrc:
pages
233-241
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/itc/2002
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/itc/BlantonCDDMV02/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/itc/BlantonCDDMV02
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/itc/itc2002.html#BlantonCDDMV02
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TEST.2002.1041765
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/itc
>
dc:
subject
failure analysis, diagnosis, fault model and characterization
(xsd:string)
dc:
title
Fault Tuples in Diagnosis of Deep-Submicron Circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document