[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/BrozAR00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_C._Andersen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jerry_J._Broz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Reynaldo_M._Rincon>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2000.894240>
foaf:homepage <https://doi.org/10.1109/TEST.2000.894240>
dc:identifier DBLP conf/itc/BrozAR00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2000.894240 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Reducing device yield fallout at wafer level test with electrohydrodynamic (EHD) cleaning. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_C._Andersen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jerry_J._Broz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Reynaldo_M._Rincon>
swrc:pages 477-484 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/BrozAR00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/BrozAR00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2000.html#BrozAR00>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2000.894240>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Reducing device yield fallout at wafer level test with electrohydrodynamic (EHD) cleaning. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document