Individual Signal Path Calibration for Maximum Timing Accuracy in a High Pincount VLSI Test System.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/CatalanoFKS83
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1983
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Individual Signal Path Calibration for Maximum Timing Accuracy in a High Pincount VLSI Test System.
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Individual Signal Path Calibration for Maximum Timing Accuracy in a High Pincount VLSI Test System.
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