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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/CatyBMLBC03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amitava_Majumdar_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ismet_Bayraktaroglu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_Bell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lisa_Curhan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Olivier_Caty>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Richard_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2003.1271083>
foaf:homepage <https://doi.org/10.1109/TEST.2003.1271083>
dc:identifier DBLP conf/itc/CatyBMLBC03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2003.1271083 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Instruction Based BIST for Board/System Level Test of External Memories and Internconnects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amitava_Majumdar_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ismet_Bayraktaroglu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_Bell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lisa_Curhan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Olivier_Caty>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Richard_Lee>
swrc:pages 961-970 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/CatyBMLBC03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/CatyBMLBC03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2003.html#CatyBMLBC03>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2003.1271083>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Instruction Based BIST for Board/System Level Test of External Memories and Internconnects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document