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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/ChangKPHLHCK23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daehyun_Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daesop_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaesik_Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shin_Hun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Siwoong_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sohee_Hwang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Suksoo_Pyo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Youngdae_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC51656.2023.00022>
foaf:homepage <https://doi.org/10.1109/ITC51656.2023.00022>
dc:identifier DBLP conf/itc/ChangKPHLHCK23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC51656.2023.00022 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daehyun_Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daesop_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaesik_Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shin_Hun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Siwoong_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sohee_Hwang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Suksoo_Pyo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Youngdae_Kim>
swrc:pages 87-92 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/ChangKPHLHCK23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/ChangKPHLHCK23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2023.html#ChangKPHLHCK23>
rdfs:seeAlso <https://doi.org/10.1109/ITC51656.2023.00022>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document