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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/ChangTLPM98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chao-Wen_Tseng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chien-Mo_James_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jonathan_T.-Y._Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mike_Purtell>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.1998.743151>
foaf:homepage <https://doi.org/10.1109/TEST.1998.743151>
dc:identifier DBLP conf/itc/ChangTLPM98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.1998.743151 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chao-Wen_Tseng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chien-Mo_James_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jonathan_T.-Y._Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mike_Purtell>
swrc:pages 184-193 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/ChangTLPM98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/ChangTLPM98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc1998.html#ChangTLPM98>
rdfs:seeAlso <https://doi.org/10.1109/TEST.1998.743151>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document