Hardware Test Pattern Generation for Built-In Testing.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/DaehnM81
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Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/itc/DaehnM81
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Joachim_Mucha
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wilfried_Daehn
>
dc:
identifier
DBLP conf/itc/DaehnM81
(xsd:string)
dcterms:
issued
1981
(xsd:gYear)
rdfs:
label
Hardware Test Pattern Generation for Built-In Testing.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Joachim_Mucha
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wilfried_Daehn
>
swrc:
pages
110-120
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/itc/1981
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/itc/DaehnM81/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/itc/DaehnM81
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/itc/itc1981.html#DaehnM81
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/itc
>
dc:
title
Hardware Test Pattern Generation for Built-In Testing.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document