[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/DrmanacL11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dragoljub_Gagi_Drmanac>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Laisne>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2011.6139143>
foaf:homepage <https://doi.org/10.1109/TEST.2011.6139143>
dc:identifier DBLP conf/itc/DrmanacL11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2011.6139143 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dragoljub_Gagi_Drmanac>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Laisne>
swrc:pages 1-10 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/DrmanacL11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/DrmanacL11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2011.html#DrmanacL11>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2011.6139143>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document