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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/FanCFVBZK06>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandeep_Kumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/William_Burchanowski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yi_Cai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongquan_Fan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zeljko_Zilic>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2006.297721>
foaf:homepage <https://doi.org/10.1109/TEST.2006.297721>
dc:identifier DBLP conf/itc/FanCFVBZK06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2006.297721 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandeep_Kumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/William_Burchanowski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yi_Cai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongquan_Fan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zeljko_Zilic>
swrc:pages 1-10 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/TEST.2006.297721>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document