An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/FanCFVBZK06
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/itc/FanCFVBZK06
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Anant_Verma
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Liming_Fang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sandeep_Kumar
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/William_Burchanowski
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yi_Cai
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yongquan_Fan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Zeljko_Zilic
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTEST.2006.297721
>
foaf:
homepage
<
https://doi.org/10.1109/TEST.2006.297721
>
dc:
identifier
DBLP conf/itc/FanCFVBZK06
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTEST.2006.297721
(xsd:string)
dcterms:
issued
2006
(xsd:gYear)
rdfs:
label
An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Anant_Verma
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Liming_Fang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sandeep_Kumar
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/William_Burchanowski
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yi_Cai
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yongquan_Fan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Zeljko_Zilic
>
swrc:
pages
1-10
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/itc/2006
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/itc/FanCFVBZK06/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/itc/FanCFVBZK06
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/itc/itc2006.html#FanCFVBZK06
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TEST.2006.297721
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/itc
>
dc:
title
An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document