[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/FergusonTL90>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/F._Joel_Ferguson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Martin_Taylor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tracy_Larrabee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.1990.114052>
foaf:homepage <https://doi.org/10.1109/TEST.1990.114052>
dc:identifier DBLP conf/itc/FergusonTL90 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.1990.114052 (xsd:string)
dcterms:issued 1990 (xsd:gYear)
rdfs:label Testing for parametric faults in static CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/F._Joel_Ferguson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Martin_Taylor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tracy_Larrabee>
swrc:pages 436-443 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1990>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/FergusonTL90/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/FergusonTL90>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc1990.html#FergusonTL90>
rdfs:seeAlso <https://doi.org/10.1109/TEST.1990.114052>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Testing for parametric faults in static CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document