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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/FrischAAGHMNRS95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Frisch>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_J._Greub>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Hazra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Stebniskey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mitch_Aigner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nicholas_J._Naclerio>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Mohr>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/T._Almy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._Russell>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.1995.529857>
foaf:homepage <https://doi.org/10.1109/TEST.1995.529857>
dc:identifier DBLP conf/itc/FrischAAGHMNRS95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.1995.529857 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Frisch>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_J._Greub>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Hazra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Stebniskey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mitch_Aigner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nicholas_J._Naclerio>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Mohr>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/T._Almy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._Russell>
swrc:pages 328-335 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/FrischAAGHMNRS95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/FrischAAGHMNRS95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc1995.html#FrischAAGHMNRS95>
rdfs:seeAlso <https://doi.org/10.1109/TEST.1995.529857>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document