Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/GeuzebroekLG02
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Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume.
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Test point insertion, ATPG, compact test sets, fault coverage, test length, stuck-at faults, gate-delay faults
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Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume.
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