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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/HamdiouiG98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.1998.743138>
foaf:homepage <https://doi.org/10.1109/TEST.1998.743138>
dc:identifier DBLP conf/itc/HamdiouiG98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.1998.743138 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Consequences of port restrictions on testing two-port memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
swrc:pages 63-72 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/HamdiouiG98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/HamdiouiG98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc1998.html#HamdiouiG98>
rdfs:seeAlso <https://doi.org/10.1109/TEST.1998.743138>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:subject Multi-port memories, single-port memories, memory fault models, weak faults, march tests, test length, fault coverage, read-only and write-only ports (xsd:string)
dc:title Consequences of port restrictions on testing two-port memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document