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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/HamzaogluP98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ilker_Hamzaoglu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.1998.743288>
foaf:homepage <https://doi.org/10.1109/TEST.1998.743288>
dc:identifier DBLP conf/itc/HamzaogluP98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.1998.743288 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Compact two-pattern test set generation for combinational and full scan circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ilker_Hamzaoglu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
swrc:pages 944-953 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/HamzaogluP98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/HamzaogluP98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc1998.html#HamzaogluP98>
rdfs:seeAlso <https://doi.org/10.1109/TEST.1998.743288>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Compact two-pattern test set generation for combinational and full scan circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document