![[RDF data]](https://dblp.l3s.de/d2r/snorql/rdf_flyer.24.gif)
| Property | Value |
|---|---|
| dcterms:bibliographicCitation | <http://dblp.uni-trier.de/rec/bibtex/conf/itc/Hansen83> |
| dc:creator | <https://dblp.l3s.de/d2r/resource/authors/Peter_Hansen> |
| dc:identifier | DBLP conf/itc/Hansen83 (xsd:string) |
| dcterms:issued | 1983 (xsd:gYear) |
| rdfs:label | New Techniques for Manufacturing Test and Diagnosis of LSSD Boards. (xsd:string) |
| foaf:maker | <https://dblp.l3s.de/d2r/resource/authors/Peter_Hansen> |
| swrc:pages | 40-45 (xsd:string) |
| dcterms:partOf | <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1983> |
| owl:sameAs | <http://bibsonomy.org/uri/bibtexkey/conf/itc/Hansen83/dblp> |
| owl:sameAs | <http://dblp.rkbexplorer.com/id/conf/itc/Hansen83> |
| rdfs:seeAlso | <http://dblp.uni-trier.de/db/conf/itc/itc1983.html#Hansen83> |
| swrc:series | <https://dblp.l3s.de/d2r/resource/conferences/itc> |
| dc:title | New Techniques for Manufacturing Test and Diagnosis of LSSD Boards. (xsd:string) |
| dc:type | <http://purl.org/dc/dcmitype/Text> |
| rdf:type | swrc:InProceedings |
| rdf:type | foaf:Document |