Fault Modeling and Testing of Memristor-Based Spiking Neural Networks.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/itc/HouCTWL22
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chi_Tung
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hsueh-Hung_Cheng
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Juin-Ming_Lu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kuan-Wei_Hou
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FITC50671.2022.00016
>
foaf:
homepage
<
https://doi.org/10.1109/ITC50671.2022.00016
>
dc:
identifier
DBLP conf/itc/HouCTWL22
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FITC50671.2022.00016
(xsd:string)
dcterms:
issued
2022
(xsd:gYear)
rdfs:
label
Fault Modeling and Testing of Memristor-Based Spiking Neural Networks.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chi_Tung
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hsueh-Hung_Cheng
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Juin-Ming_Lu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kuan-Wei_Hou
>
swrc:
pages
92-99
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/itc/2022
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/itc/HouCTWL22/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/itc/HouCTWL22
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/itc/itc2022.html#HouCTWL22
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ITC50671.2022.00016
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/itc
>
dc:
title
Fault Modeling and Testing of Memristor-Based Spiking Neural Networks.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document