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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/JohnsonNJCMD16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Brian_Noble>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cynthia_Manya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jim_Crafts>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_Deforge>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mark_Johnson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Johnson>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2016.7805871>
foaf:homepage <https://doi.org/10.1109/TEST.2016.7805871>
dc:identifier DBLP conf/itc/JohnsonNJCMD16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2016.7805871 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Brian_Noble>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cynthia_Manya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jim_Crafts>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_Deforge>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mark_Johnson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Johnson>
swrc:pages 1-8 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2016>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/JohnsonNJCMD16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/JohnsonNJCMD16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2016.html#JohnsonNJCMD16>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2016.7805871>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document