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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/KimBKJK08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bai-Sun_Kong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eon-Jo_Byunb>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gyu-Yeol_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ki-Sang_Kang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Young-Hyun_Jun>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2008.4700571>
foaf:homepage <https://doi.org/10.1109/TEST.2008.4700571>
dc:identifier DBLP conf/itc/KimBKJK08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2008.4700571 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Wafer-Level Characterization of Probecards using NAC Probing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bai-Sun_Kong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eon-Jo_Byunb>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gyu-Yeol_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ki-Sang_Kang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Young-Hyun_Jun>
swrc:pages 1-9 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/KimBKJK08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/KimBKJK08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2008.html#KimBKJK08>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2008.4700571>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Wafer-Level Characterization of Probecards using NAC Probing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document