[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/KornegayR95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kevin_T._Kornegay>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.1995.529833>
foaf:homepage <https://doi.org/10.1109/TEST.1995.529833>
dc:identifier DBLP conf/itc/KornegayR95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.1995.529833 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Integrated Test Solutions and Test Economics for MCMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kevin_T._Kornegay>
swrc:pages 193-201 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/KornegayR95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/KornegayR95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc1995.html#KornegayR95>
rdfs:seeAlso <https://doi.org/10.1109/TEST.1995.529833>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Integrated Test Solutions and Test Economics for MCMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document