![[RDF data]](https://dblp.l3s.de/d2r/snorql/rdf_flyer.24.gif)
| Property | Value |
|---|---|
| dcterms:bibliographicCitation | <http://dblp.uni-trier.de/rec/bibtex/conf/itc/Lala86> |
| dc:creator | <https://dblp.l3s.de/d2r/resource/authors/Parag_K._Lala> |
| dc:identifier | DBLP conf/itc/Lala86 (xsd:string) |
| dcterms:issued | 1986 (xsd:gYear) |
| rdfs:label | On Built-In Testing of VLSI Chips. (xsd:string) |
| foaf:maker | <https://dblp.l3s.de/d2r/resource/authors/Parag_K._Lala> |
| swrc:pages | 719-721 (xsd:string) |
| dcterms:partOf | <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1986> |
| owl:sameAs | <http://bibsonomy.org/uri/bibtexkey/conf/itc/Lala86/dblp> |
| owl:sameAs | <http://dblp.rkbexplorer.com/id/conf/itc/Lala86> |
| rdfs:seeAlso | <http://dblp.uni-trier.de/db/conf/itc/itc1986.html#Lala86> |
| swrc:series | <https://dblp.l3s.de/d2r/resource/conferences/itc> |
| dc:title | On Built-In Testing of VLSI Chips. (xsd:string) |
| dc:type | <http://purl.org/dc/dcmitype/Text> |
| rdf:type | swrc:InProceedings |
| rdf:type | foaf:Document |