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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/LiYHWTHC03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Archer_Hsu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eugene_Chow>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jen-Chieh_Yeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jin-Fu_Li_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peir-Yuan_Tsai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rei-Fu_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2003.1270863>
foaf:homepage <https://doi.org/10.1109/TEST.2003.1270863>
dc:identifier DBLP conf/itc/LiYHWTHC03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2003.1270863 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Archer_Hsu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eugene_Chow>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jen-Chieh_Yeh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jin-Fu_Li_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peir-Yuan_Tsai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rei-Fu_Huang>
swrc:pages 393-402 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/LiYHWTHC03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/LiYHWTHC03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2003.html#LiYHWTHC03>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2003.1270863>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:subject built-in self-test, built-in self-repair, built-in redundancy-analysis, memory testing, semiconductor memory (xsd:string)
dc:title A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document