CMOS Built-In Test Architecture for High-Speed Jitter Measurement.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/LinTCCSHHB03
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/itc/LinTCCSHHB03
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Alan_Chong
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Eddie_Chan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Henry_C._Lin
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hosam_Haggag
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jeff_Huard
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jim_Braatz
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Karen_Taylor
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mani_Soma
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTEST.2003.1270826
>
foaf:
homepage
<
https://doi.org/10.1109/TEST.2003.1270826
>
dc:
identifier
DBLP conf/itc/LinTCCSHHB03
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTEST.2003.1270826
(xsd:string)
dcterms:
issued
2003
(xsd:gYear)
rdfs:
label
CMOS Built-In Test Architecture for High-Speed Jitter Measurement.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Alan_Chong
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Eddie_Chan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Henry_C._Lin
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hosam_Haggag
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jeff_Huard
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jim_Braatz
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Karen_Taylor
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mani_Soma
>
swrc:
pages
67-76
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/itc/2003
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/itc/LinTCCSHHB03/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/itc/LinTCCSHHB03
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/itc/itc2003.html#LinTCCSHHB03
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TEST.2003.1270826
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/itc
>
dc:
title
CMOS Built-In Test Architecture for High-Speed Jitter Measurement.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document