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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/LorenzelliEGGKL23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexander_Grill>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Jan_Marinissen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francesco_Lorenzelli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Georges_G._E._Gielen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kristiaan_De_Greve>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michele_Stucchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ruoyu_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefan_Kubicek>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC51656.2023.00031>
foaf:homepage <https://doi.org/10.1109/ITC51656.2023.00031>
dc:identifier DBLP conf/itc/LorenzelliEGGKL23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC51656.2023.00031 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexander_Grill>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Asser_Elsayed>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Clement_Godfrin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Danny_Wan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Jan_Marinissen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francesco_Lorenzelli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Georges_G._E._Gielen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kristiaan_De_Greve>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michele_Stucchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ruoyu_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefan_Kubicek>
swrc:pages 151-158 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ITC51656.2023.00031>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document