[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/LuTM22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kohei_Miyase>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shi-Chun_Tseng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shyue-Kung_Lu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC50671.2022.00047>
foaf:homepage <https://doi.org/10.1109/ITC50671.2022.00047>
dc:identifier DBLP conf/itc/LuTM22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC50671.2022.00047 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kohei_Miyase>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shi-Chun_Tseng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shyue-Kung_Lu>
swrc:pages 391-399 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/LuTM22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/LuTM22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2022.html#LuTM22>
rdfs:seeAlso <https://doi.org/10.1109/ITC50671.2022.00047>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document