New Test Paradigms for Yield and Manufacturability. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/itc/Madge04>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Robert_Madge>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FTEST.2004.1386930>
foaf:homepage	<https://doi.org/10.1109/TEST.2004.1386930>
dc:identifier	DBLP conf/itc/Madge04 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FTEST.2004.1386930 (xsd:string)
dcterms:issued	2004 (xsd:gYear)
rdfs:label	New Test Paradigms for Yield and Manufacturability. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Robert_Madge>
swrc:pages	13 (xsd:string)
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owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/itc/Madge04/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/itc/Madge04>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/itc/itc2004.html#Madge04>
rdfs:seeAlso	<https://doi.org/10.1109/TEST.2004.1386930>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title	New Test Paradigms for Yield and Manufacturability. (xsd:string)
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rdf:type	swrc:InProceedings
rdf:type	foaf:Document