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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/MenozziLSR90>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bruno_Ricc%E2%88%9A%E2%89%A4>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luca_Selmi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Massimo_Lanzoni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roberto_Menozzi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.1990.114126>
foaf:homepage <https://doi.org/10.1109/TEST.1990.114126>
dc:identifier DBLP conf/itc/MenozziLSR90 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.1990.114126 (xsd:string)
dcterms:issued 1990 (xsd:gYear)
rdfs:label An improved procedure to test CMOS ICs for latch-up. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bruno_Ricc%E2%88%9A%E2%89%A4>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luca_Selmi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Massimo_Lanzoni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roberto_Menozzi>
swrc:pages 1028-1034 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1990>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/MenozziLSR90/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/MenozziLSR90>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc1990.html#MenozziLSR90>
rdfs:seeAlso <https://doi.org/10.1109/TEST.1990.114126>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title An improved procedure to test CMOS ICs for latch-up. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document