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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/MolyneauxZKAHH07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alex_Hsieh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hong_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_F._Molyneaux>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shahryar_Aryani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sungbae_Hwang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_A._Ziaja>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2007.4437561>
foaf:homepage <https://doi.org/10.1109/TEST.2007.4437561>
dc:identifier DBLP conf/itc/MolyneauxZKAHH07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2007.4437561 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alex_Hsieh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hong_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_F._Molyneaux>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shahryar_Aryani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sungbae_Hwang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_A._Ziaja>
swrc:pages 1-8 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2007>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2007.html#MolyneauxZKAHH07>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2007.4437561>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document