Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/MurrayDR83
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DBLP conf/itc/MurrayDR83
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1983
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Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost.
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Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost.
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