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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/NadkarniAWC06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Igor_Arsovski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rahul_Nadkarni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Reid_Wistort>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Valerie_Chickanosky>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2006.297700>
foaf:homepage <https://doi.org/10.1109/TEST.2006.297700>
dc:identifier DBLP conf/itc/NadkarniAWC06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2006.297700 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Improved Match-Line Test and Repair Methodology Including Power-Supply Noise Testing for Content-Addressable Memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Igor_Arsovski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rahul_Nadkarni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Reid_Wistort>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Valerie_Chickanosky>
swrc:pages 1-9 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/NadkarniAWC06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/NadkarniAWC06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2006.html#NadkarniAWC06>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2006.297700>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Improved Match-Line Test and Repair Methodology Including Power-Supply Noise Testing for Content-Addressable Memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document