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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/Nejedlo03a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jay_J._Nejedlo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2003.1270909>
foaf:homepage <https://doi.org/10.1109/TEST.2003.1270909>
dc:identifier DBLP conf/itc/Nejedlo03a (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2003.1270909 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label IBISTTM (Interconnect Built-in Self-Test) Architecture and Methodology for PCI Express: Intel?s Next-Generation Test and Validation Methodology for Performance IO. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jay_J._Nejedlo>
swrc:pages 784 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2003>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2003.html#Nejedlo03a>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2003.1270909>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title IBISTTM (Interconnect Built-in Self-Test) Architecture and Methodology for PCI Express: Intel?s Next-Generation Test and Validation Methodology for Performance IO. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document