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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/Nigh12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Phil_Nigh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2012.6401528>
foaf:homepage <https://doi.org/10.1109/TEST.2012.6401528>
dc:identifier DBLP conf/itc/Nigh12 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2012.6401528 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
rdfs:label How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond? (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Phil_Nigh>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2012>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/Nigh12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/Nigh12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2012.html#Nigh12>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2012.6401528>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond? (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document