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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/PandeyLNGNSSC20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arani_Sinha>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sanya_Gupta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shreyas_Nandi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sujay_Pandey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Suriyaprakash_Natarajan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhiwei_Liao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC44778.2020.9325240>
foaf:homepage <https://doi.org/10.1109/ITC44778.2020.9325240>
dc:identifier DBLP conf/itc/PandeyLNGNSSC20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC44778.2020.9325240 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arani_Sinha>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sanya_Gupta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shreyas_Nandi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sujay_Pandey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Suriyaprakash_Natarajan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhiwei_Liao>
swrc:pages 1-10 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2020>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2020.html#PandeyLNGNSSC20>
rdfs:seeAlso <https://doi.org/10.1109/ITC44778.2020.9325240>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document