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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/PoehlBAMTKMR03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frank_Poehl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mark_Kassab>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matthias_Beck>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nagesh_Tamarapalli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nilanjan_Mukherjee_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_Muhmenthaler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ralf_Arnold>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2003.1271110>
foaf:homepage <https://doi.org/10.1109/TEST.2003.1271110>
dc:identifier DBLP conf/itc/PoehlBAMTKMR03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2003.1271110 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frank_Poehl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mark_Kassab>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matthias_Beck>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nagesh_Tamarapalli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nilanjan_Mukherjee_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_Muhmenthaler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ralf_Arnold>
swrc:pages 1211-1220 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/PoehlBAMTKMR03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/PoehlBAMTKMR03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2003.html#PoehlBAMTKMR03>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2003.1271110>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document