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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/QuachPFKO02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bob_Kopitzke>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Minh_Quach>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pete_O%27Neill>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tim_Figal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tuan_Pham>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2002.1041820>
foaf:homepage <https://doi.org/10.1109/TEST.2002.1041820>
dc:identifier DBLP conf/itc/QuachPFKO02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2002.1041820 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bob_Kopitzke>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Minh_Quach>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pete_O%27Neill>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tim_Figal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tuan_Pham>
swrc:pages 683-692 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/QuachPFKO02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/QuachPFKO02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2002.html#QuachPFKO02>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2002.1041820>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document