[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/RighterHSM98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alan_W._Righter>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Charles_F._Hawkins>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jerry_M._Soden>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_C._Maxwell>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.1998.743152>
foaf:homepage <https://doi.org/10.1109/TEST.1998.743152>
dc:identifier DBLP conf/itc/RighterHSM98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.1998.743152 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label CMOS IC reliability indicators and burn-in economics. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alan_W._Righter>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Charles_F._Hawkins>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jerry_M._Soden>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_C._Maxwell>
swrc:pages 194-203 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/RighterHSM98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/RighterHSM98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc1998.html#RighterHSM98>
rdfs:seeAlso <https://doi.org/10.1109/TEST.1998.743152>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title CMOS IC reliability indicators and burn-in economics. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document